Dynamut: A Mutation Testing Tool for Industry-Level Embedded System Applications


Authors

Darin Weffenstette and Kristen R. Walcott
University of Colorado, USA

Abstract

Test suite evaluation is important when developing quality software. Mutation testing, in particular, can be helpful in determining the ability of a test suite to find defects in code. Because of challenges incurred developing on complex embedded systems, test suite evaluation on these systems is very difficult and costly. We developed and implemented a tool called DynaMut to insert conditional mutations into the software under test for embedded applications. We then demonstrate how the tool can be used to automate the collection of data using an existing proprietary embedded test suite in a runtime testing environment. Conditional mutation is used to reduce the time and effort needed to perform test quality evaluation in 48% to 67% less time than it would take to perform the testing with a more traditional mutate-compile-test methodology. We also analyze if testing time can be further reduced while maintaining quality by sampling the mutations tested.

Keywords

Test Development, Embedded Test Suites, Test Case Sampling, Mutation Testing